X-ray diffraction techniques applied to prospection of fluvial aggregates
نویسندگان
چکیده
منابع مشابه
Application of X-ray Diffraction Techniques to the Semiconductor Field
generally arranged at a distance of 0.1 nm to 0.5 nm from one another. When such a substance is irradiated with X-rays having a wavelength roughly equivalent to the interatomic or intermolecular distance, the Xray diffraction phenomenon will take place. X-ray diffraction is widely used in the semiconductor field because it is nondestructive and yields crystal structure information relatively ea...
متن کاملAdvances in array detectors for X-ray diffraction techniques.
Improved focal plane array detector systems are described which can provide improved readout speeds, random addressing and even be employed to simultaneously measure position, intensity and energy. This latter capability promises to rekindle interests in Laue techniques. Simulations of three varieties of foil mask spectrometer in both on- and off-axis configurations indicate that systems of sta...
متن کاملData preparation and evaluation techniques for x-ray diffraction microscopy.
The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-...
متن کاملIntroducing an Optimized Method for Obtaining X-ray Diffraction Patterns of Biological Tissues
Introduction Individual X-Ray diffraction patterns of biological tissues are obtained via interference of coherent scattering with their electrons. Many scientists have distinguished normal and cancerous breast tissue, bone density, and urinary stone types using the X-Ray diffraction patterns resulting from coherent scattering. The goal of this study was to introduce an optimized method for obt...
متن کاملX-ray diffraction.
where the peak shapes were described by a pseudo-Voigt function and the background was modeled with an 6-term polynomial. Additionally, the PXRD patterns obtained at room temperature and 100 K were analyzed by Le Bail refinement using the GSAS and EXPGUI software, 2,3 where the peak shapes were described by a pseudo-Voigt function (CW profile function 3) and the background was modeled with an 4...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2006
ISSN: 0108-7673
DOI: 10.1107/s0108767306095882